Key Features

• Up to 400 µm measuring range
• 10 nm resolution
• Advanced surface roughness analysis
• Large graphical display
• Multiple roughness parameters
• Long traverse capability
• Extended pickup reach
• Portable or bench-mounted operation
• Specialized pickup options
• Strong choice for advanced QC laboratories

Overview

The Starrett SR400 extends the SR300 platform with a substantially larger measuring range for demanding surface-profile and roughness applications.

With up to 400 µm measuring range at 10 nm resolution, the SR400 is for customers who need greater vertical measurement capability while retaining the flexibility of Starrett's portable/bench surface-testing platform. Where the SR300's 200 µm range runs out — rougher as-cast, as-forged or heavily machined surfaces — the SR400 still resolves the profile.

Applications

Advanced quality-control laboratories, surface-profile analysis on rougher surfaces, and specialized measurement configured through the comprehensive selection of optional pickups and accessories.